报告题目：Scanning Confocal Electron Microscopy (SCEM)
报告时间：7月6日14：30-15:30
地点：教十一电镜中心会议室
联系人：金传洪， 87953700, chhjin@zju.edu.cn
报告摘要：
The development of spherical aberration correctors for transmission electron microscopes (TEMs) has greatly reduced their depth resolution to typical just a few nanometers, which allows to probe information within three dimensional (3D) objects at a well-defined depth, a process called optical sectioning. In similar fashion, scanning confocal laser microscopy (SCLM) has been widely and successfully implemented in optical microscopy due to the fact that scattering from points away from the confocal point are detected less strongly than the in-focus scattering. In the electron-optical analogue, recently we has realized this confocal configuration, known as scanning confocal electron microscopy (SCEM) on a double aberration corrected TEM. They predicted a depth resolution of ca. 3.5 nm on a 200kV instrument with a 30 mrad semi-angle apertures. Therefore, an opportunity exists to optically section samples to provide 3D information.
Here I will present several operation modes derived from this SCEM configuration, namely bright field, energy filtered and annual dark field SCEMs. I will demonstrate the methods for establishing their electron trajectories and discuss resolution limits in terms of their optical transfer functions in reciprocal space. Finally I will explain their imaging mechanisms using theoretical calculations and recent experimental results of 3D reconstructions.
报告人简历:王鹏,2001年本科毕业于哈尔滨工业大学，2003年硕士毕业于韩国庆北大学。随后赴英国利物浦大学从事超高分辨率电子显微镜在材料表征上的应用及研究。2006年获得博士学位。先后在英国国家超高分辨率电子显微镜实验室SuperSTEM和牛津大学材料系电子显微镜课题组共做六年的博士后研究。12月被南京大学现代工程与应用科学学院聘为教授，依托于南京大学固体微结构物理国家重点实验室。现负责南京大学原子像显微实验室的建设及科研管理工作.
